Energy-dispersive X-ray analysis on thin sections and unimpregnated soil material.

Abstract

A combination of scanning electron microscopy (SEM) and energy-dispersive X-ray analysis (EDXRA) was used in the study of soil materials. The investigation in situ of components in thin sections was used to estimate chemical elements with atomic numbers 11 upwards, from sodium on. EDXRA could detect chemical elements up to magnifications of X 10 000. The composition of amorphous and micro-crystalline materials cannot be estimated in thin sections by light microscopy but by this technique was clearly displayed. Composition of loose soil material can also be investigated. The material that could be studied by SEM-EDXRA did not need high polishing of the thin section, and the plastic used for impregnation of the soil material was not affected by the investigation.Identification of chemical elements in situ, high resolution of the topographic image and relatively short testing times for the elements make this combination of techniques useful for soil research. (Abstract retrieved from CAB Abstracts by CABI’s permission)