Light and heavy element detection in thin sections of soils with the ion microprobe mass analyzer (IMMA).

Authors

  • E.B.A. Bisdom
  • S. Henstra
  • A. Jongerius
  • J.D. Brown
  • A.P. Von Rosenstiel
  • D.J. Gras

DOI:

https://doi.org/10.18174/njas.v25i1.17139

Abstract

Previous research with the scanning electron microscope (SEM)-energy dispersive X-ray analyzer (EDXRA) and the electron microprobe analyzer (EMA), showed that the detection of light elements in thin sections of soils was problematic or even impossible. Consequently initial experiments were performed with the ion microprobe mass analyzer (IMMA). These preliminary investigations were carried out on a piece of root material in soil (containing both light and heavy elements) which has a 'clayey' appearance and is known as a clayified root (Parfenova et al., 1964). The presence of heavier elements in this sample was investigated by SEM-EDXRA prior to IMMA analysis. The results with the ion microprobe mass analyzer showed that all chemical elements could be analyzed in the plant fragment. Also much higher elemental detection sensitivities were found with IMMA as compared to SEM-EDXRA and EMA. This even allowed ion imaging of trace elements. High-quality ion images of both light and heavy elements could be obtained in much shorter exposure times than with SEM-EDXRA and EMA techniques. Furthermore by analysis of fragmentation ('fingerprint') spectra additional information was obtained with respect to the chemical binding of the analyzed elements. Due to these preliminary results IMMA offers full possibilities for microchemical analysis in situ of all important elements in soil specimens. This technique considerably increases possibilities in soil micromorphology. (Abstract retrieved from CAB Abstracts by CABI’s permission)

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Published

1977-02-01

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Section

Papers